G - Physics – 01 – N
Patent
G - Physics
01
N
G01N 30/72 (2006.01) G01N 1/00 (2006.01) G01N 37/00 (2006.01) H01J 49/00 (2006.01) H01J 49/26 (2006.01)
Patent
CA 2498878
A mass spectrometry ionization method in which electrospray droplets or solid sample matrices are exposed to an ion beam thereby increasing the unbalanced charge of the analyte is provided. In another embodiment, a mass spectrometry ionization method in which ionization of the sample is achieved by directing an ion beam at a liquid or solid sample matrix containing analyte thereby ionizing and adding unbalanced charge to the analyte is provided.
L'invention concerne un procédé d'ionisation pour spectrométrie de masse qui consiste à exposer des gouttelettes d'électronébulisation ou des matrices d'échantillons solides à un faisceau ionique, ce qui augmente la charge non équilibrée de l'analyte. Dans un autre mode de réalisation, l'invention concerne un procédé d'ionisation pour spectrométrie de masse qui consiste à réaliser l'ionisation de l'échantillon par orientation d'un faisceau ionique vers un analyte contenant une matrice d'échantillon liquide ou solide, ce qui permet d'ioniser et d'ajouter à l'analyte une charge non équilibrée.
Fetherstonhaugh & Co.
Target Discovery Inc.
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