Method for inspection process development or improvement and...

G - Physics – 06 – Q

Patent

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Details

G06Q 90/00 (2006.01) G09B 19/00 (2006.01) G06Q 10/00 (2006.01)

Patent

CA 2585566

A method of developing or improving a parts inspection process, the method comprising: selecting at least one target part for inspection; convening a panel to review samples of the target part, and to define conditions and determine a disposition of the target part samples; conducting initial inspections of the target part samples to obtain sample inspection results; comparing the sample inspection results with the conditions and disposition of the target part samples set by the panel; determining a cause of variability between the sample inspection results and the conditions and disposition of the target part samples set by the panel and generating one or more solutions for the cause of variability; creating an inspection standard based on the one or more solutions; conducting training of inspectors using the inspection standard, with inspectors which qualify on the training proceeding with routine inspections; and conducting reviews of the routine inspections to determine an inspection error rate; wherein the routine inspections are allowed to continue if an acceptable inspection error rate is achieved, and wherein an inspection standard review is performed if an unacceptable inspection error rate is achieved.

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