Method for locating an impact on a surface and device for...

Details Method for locating an impact on a surface and device for... Method for locating an impact on a surface and device for...

G - Physics

06

F

G06F 3/043 (2006.01)

Patent

CA 2576379

Method for locating an impact on a surface (9), in which acoustic sensors (6) pick up acoustic signals ski (t) generated by the impact and the impact is located by calculating, for a number of reference points of index j, a validation parameter representative of a function: PRODkj i 1 i 2 ..i 2P (.omega.)=øSkil (.omega.) ØRjil (.omega.) * øSki2 (.omega.) * øRji2 (.omega.) ...ØSki2p (.omega.)* ØRji2p (.omega.) where: ØSki (.omega.) and ØRji (.omega.)* are complex phases of Ski (.omega.) and of Rji (.omega.) , for i = i1, i2, ... , i2p, indices denoting sensors, Ski(.omega.) and Rji(.omega.) being the Fourier transform of ski (t) and rji (t) , rji (t) being a reference signal corresponding to the sensor i for an impact at the reference point j, p being a non-zero integer no greater than NSENS/2.

Méthode pour localiser un impact sur une surface (9), selon laquelle des détecteurs acoustiques (6) capturent des signaux acoustiques ski (t) générés par l~impact et l~impact est localisé en calculant pour un certain nombre de points de référence d~index j un paramètre de validation représentatif d~une fonction : PRODkj i 1 i 2 ..i 2P (.omega.)=øSkil (.omega.) ØRjil (.omega.) * øSki2 (.omega.) * øRji2 (.omega.) ...ØSki2p (.omega.)* ØRji2p (.omega.) où : ØSki (.omega.) et ØRji (.omega.)* sont des phases complexes de Ski (.omega.) et de Rji (.omega.) , pour i = i1, i2, ... , i2p, indices désignant des détecteurs, Ski(.omega.) et Rji(.omega.) étant la transformée de Fourier de ski (t) et rji (t) , rji (t) étant un signal de référence correspondant au détecteur i pour un impact au point de référence j, p étant un entier différent de zéro non supérieur à NSENS/2.

Affiliated with

Also associated with

Rating

Method for locating an impact on a surface and device for... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for locating an impact on a surface and device for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for locating an impact on a surface and device for... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1344440