G - Physics – 01 – B
Patent
G - Physics
01
B
G01B 11/06 (2006.01) G01B 11/08 (2006.01)
Patent
CA 2518702
The invention relates to a method for measurement of three-dimensional objects by single-view backlit shadowgraphy. According to the invention, at least one geometrical parameter of such an object (32), for example, the thickness of a hollow sphere, translucent or transparent to a visible light, may be measured, by determination of the optical characteristics of the object, by means of which at least one optical model for the propagation of light through the object can be established, said model comprising at least one equation relating said parameter to the result of an observation made directly on an image of the object. Said image is produced by observation of the object with single-view backlit shadowgraphy, whereby said image is acquired, the observation is made, and the parameter is determined by means of the equation and the result of the observation.
Procédé de mesure d'objets tridimensionnels par ombroscopie optique à une seule vue. Selon l'invention, pour mesurer au moins un paramètre géométrique d'un tel objet (32) , par exemple l'épaisseur d'une sphère creuse, translucide ou transparente vis vis d'une lumière visible, on détermine des caractéristiques optiques de l'objet, à l'aide desquelles on établit au moins un modèle optique de la propagation de la lumière à travers l'objet, ce modèle comportant une équation qui relie le paramètre au résultat d'une observation effectuée directement sur une image de l'objet, cette image étant acquise en observant cet objet par ombroscopie à une seule vue, on acquiert cette image, on effectue l'observation, et l'on détermine le paramètre à l'aide de l'équation et du résultat de l'observation.
Diou Alain
Lamy Francis
Pascal Ghislain
Voisin Yvon
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