Method for measuring a three-dimensional object, or assembly...

G - Physics – 01 – B

Patent

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G01B 11/00 (2006.01) G01B 11/02 (2006.01)

Patent

CA 2376786

The invention concerns a method whereby three-dimensional objects (1, 5, 6) of an environment which can be very complex can be observed by locating their simple contour forms on images, and then the geometrical characteristics, positions and orientations of said objects are measured. The contours are defined by simple parameters of length, inclination, position and the like. For each new image, the previously acquired knowledge of the environment is used to fine-tune the estimates while introducing into the model the new contours of the objects which have appeared.

Dans ce système, des objets tridimensionnels (1, 5, 6) d'un environnement pouvant être très complexe sont discernés en repérant leurs formes simples de contour sur des images, puis on mesure les caractéristiques géométriques de ces objets et leurs positions et orientations. Les contours sont définis par des paramètres simples de longueur, d'inclinaison, de position, etc. A chaque nouvelle image, on utilise la connaissance acquise de l'environnement pour affiner les estimations tout en introduisant dans le modèle les nouveaux contours d'objets qui sont apparus.

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