Method for measuring low capacities

Details Method for measuring low capacities Method for measuring low capacities

G - Physics

01

R

324/44

G01R 27/26 (2006.01)

Patent

CA 1128129

ABSTRACT OF THE DISCLOSURE The present invention provides a method for measuring low capacities with the elimination of the influence of stray capacitances, which method makes use of an RC oscillator circuit, whose output impedance depends on the measured capacitance; wherein the measured capacitance is connected between a low- impedance generator and a circuit measuring only current.

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