G - Physics – 01 – N
Patent
G - Physics
01
N
G01N 23/20 (2006.01)
Patent
CA 2460647
The present invention relates to a method for performing a transmission diffraction analysis of an analyte on a support surface, wherein the method comprises: irradiating said analyte with a radiation beam generated by a source of radiation, and detecting said radiation after passing through the analyte. The method is characterised in that irradiation is performed such that the radiation beam strikes the analyte in a substantially vertical and substantially perpendicular direction. Further the present invention relates to an apparatus for performing a transmission diffraction analysis.
L'invention concerne un procédé permettant de réaliser une analyse de diffraction de transmission d'analyte sur une surface de support. Ce procédé consiste : à irradier ledit analyte au moyen d'un faisceau de rayonnement produit par une source de rayonnement; et à détecter ledit rayonnement après son passage à travers l'analyte. Le procédé selon l'invention se caractérise en ce que l'irradiation est réalisée de telle manière que le faisceau de rayonnement frappe l'analyte dans une direction sensiblement verticale et sensiblement perpendiculaire. L'invention concerne également un appareil permettant de réaliser cette analyse de diffraction de transmission.
Abrahams Jan Pieter
Blomsma Erwin
Van Langevelde Adriaan Jan
Avantium International B.v.
Gowling Lafleur Henderson Llp
LandOfFree
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