G - Physics – 01 – T
Patent
G - Physics
01
T
G01T 1/10 (2006.01) G01T 1/105 (2006.01)
Patent
CA 2067814
M-center luminescence is used to measure radiation. An LiF crystal (20) is excited with a 442 nm He-Cd laser because absorption measurements in LiF indicate the peak of the M-center absorption occurs at 443 nm. Laser stimulation produces an excited state of the M-center, which undergoes a very strong Stokes' shift. The peak of the M-center emission spectrum occurs, at 665 nm with a half-width of 0.36 ev. Since the excitation wavelength differs significantly from the emission wavelength, measurement of the deep red emission can be done simultaneously with the excitation. The population of M-centers grows with increasing radiation damage, and therefore M-center luminescence provides a basis for radiation dosimetry.
On utilise la luminescence des centres M afin de mesurer des radiations. On excite un crystal LiF (20) à l'aide d'un laser (442) nm He-Cd, car les mesures d'absorption dans LiF indiquent que la crête de l'absorption des centres M se produit à 443 nm. La stimulation laser produit un état excité du centre M, lequel subit un fort décalage de coup. La crête du spectre d'émission du centre M se produit à 665 nm avec une demi largeur de 0,36 ev. Puisque la longueur d'onde d'excitation diffère de manière significative de la longueur d'onde d'émission, on peut procéder simultanément à la mesure de l'émission rouge foncé et de l'excitation. La population de centres M croît avec l'augmentation des détériorations par radiations, et par conséquent la luminescence des centres M produit une base de dosimétrie de radiation.
Battelle Memorial Institute
Fetherstonhaugh & Co.
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