Method for the examination of continuously conveyed workpieces

Details Method for the examination of continuously conveyed workpieces Method for the examination of continuously conveyed workpieces

G - Physics

01

N

G01N 21/88 (2006.01) B29C 65/82 (2006.01) B31B 19/74 (2006.01) G01N 21/84 (2006.01) G06F 15/70 (1990.01)

Patent

CA 2097001

1090-31 A METHOD FOR THE EXAMINATION OF CONTINUOUSLY CONVEYED WORKPIECES ABSTRACT A method for the examination of continuously conveyed workpieces and more particularly for the examination of the configuration of folds, or of bay ends, or the printed matter on bags, is provided using a CCD semiconductor camera. The image produced by the camera is visually examined, or compared, with a master which corresponds to the desired form of the workpiece. In order to be able to perform the examination of the workpieces on a short conveying path, sequential images, of which there are at least two, are produced of the part of the workpiece to be examined. The images are then assembled to constitute the complete area to be compared to the master. The use of partial sequential images permits the examination to be performed in a smaller area of the apparatus. This allows existing machines to accommodate the required devices without expensive modification.

Affiliated with

Also associated with

Rating

Method for the examination of continuously conveyed workpieces does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for the examination of continuously conveyed workpieces, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for the examination of continuously conveyed workpieces will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1770218