Method of and apparatus for deterministically obtaining...

F - Mech Eng,Light,Heat,Weapons – 16 – K

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F16K 37/00 (2006.01) G01M 99/00 (2011.01) F16K 31/365 (2006.01) G01M 17/00 (2006.01) G05B 23/02 (2006.01) G05D 16/20 (2006.01)

Patent

CA 2304518

A diagnostic test unit for deterministically measuring one or more parameters, such as dead band, dead time, response time, gain, or overshoot, of a process control device that is connected in a process control loop during operation of a process includes a switch controller, a signal generator, a switch, a response accumulator mechanism, and an analyzer mechanism. The swtich controller monitors a process signal during operation of the process to determine whether the process signal is substantially stable. In the event that the process signal is substantially stable, the switch replaces a control signal with a diagnostic test signal generated by the signal generator. The response accumulator is in communication with the process control loop to obtain an indication of the response of the process control device to the diagnostic test signal. The analyzer unit then determines the device parameter from the test signal and the response indication.

Unité d'essai diagnostique permettant faire des mesures déterministes pour un ou plusieurs paramètres, tels que zone morte, temps mort, temps de réponse, gain ou dépassement, d'un dispositif de commande de processus faisant partie d'une boucle de commande de processus durant la réalisation d'un processus. L'unité comprend un module de commande de commutateur, un générateur de signaux, un commutateur, un mécanisme d'accumulation de réponses et un mécanisme d'analyse. Le module de commande du commutateur surveille un signal de processus durant la réalisation dudit processus, de façon à déterminer si ledit signal est sensiblement stable. Si c'est le cas, le commutateur remplace un signal de commande par un signal d'essai diagnostique généré par le générateur de signaux. L'accumulateur de réponses est en communication avec la boucle de commande de processus, de façon à obtenir une indication de la réponse dudit dispositif au signal d'essai. L'unité d'analyse détermine ensuite le paramètre du dispositif à partir du signal d'essai et de l'indication de réponse.

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