Method of and apparatus for examining substances and...

Details Method of and apparatus for examining substances and... Method of and apparatus for examining substances and...

G - Physics

01

N

324/2

G01N 27/00 (2006.01) B04B 5/04 (2006.01) B04B 5/10 (2006.01) G01N 9/30 (2006.01)

Patent

CA 1151241

ABSTRACT OF THE DISCLOSURE A method of an apparatus for examining substances by subjecting them to a mechanical force while measuring the electrical effect derived from any resulting charge orientation. The mechanical force can be obtained by linearly accelerating or decelerating the sample but a centrifuge is preferably employed to give high g forces; an electrode system is used to provide an output signal. The output signal can be plotted against changing g forces to give a force spec- trum analysis graph. An apparatus for using such method is also described. The apparatus comprises a direct or capacitive electrode system with one or more electrodes made of noble metal,

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