G - Physics – 01 – N
Patent
G - Physics
01
N
73/58
G01N 21/84 (2006.01) G01N 21/55 (2006.01)
Patent
CA 1304600
METHOD OF AND APPARATUS FOR REAL TIME CRYSTALLOGRAPHIC AXIS ORIENTATION DETERMINATION Abstract of the Disclosure A specific small area of a crystal sample is scanned by a laser beam in a spiral pattern. The laser beam is reflected different amounts for different beam positions to produce a reflectance pattern indicative of crystallographic orientation.
547187
Mcfadden Fincham
Weiser Sidney
LandOfFree
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