Method of and device for measuring echo parameters on...

Details Method of and device for measuring echo parameters on... Method of and device for measuring echo parameters on...

H - Electricity

04

M

H04M 3/26 (2006.01) H04B 3/46 (2006.01)

Patent

CA 2295226

A test signal is injected into the line and the corresponding return signal produced by the line itself as an effect of the echo is detected. A signal having lenticular envelope is used as test signal and is generated preferably starting from a first sinusoid with a first given frequency modulated in amplitude with a second sinusoid having a second given frequency, lower than the aforesaid first given frequency.

Ce procédé consiste à injecter un signal d'essai sur la ligne (L) et à détecter le signal de retour correspondant produit par la ligne elle-même par effet d'écho. Le signal d'essai utilisé est un signal à enveloppe lenticulaire, qu'on produit de préférence en partant d'une première sinusoïde présentant une première fréquence donnée, modulée en amplitude par une seconde sinusoïde présentant une seconde fréquence donnée, plus basse que la première fréquence.

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