Method of bi-directional thermal calibration of a circuit...

H - Electricity – 01 – H

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Details

H01H 71/74 (2006.01) G01R 31/327 (2006.01) H01H 71/14 (2006.01)

Patent

CA 2668343

A circuit breaker test system includes a circuit breaker under test having a deformable frame with an elongated slot, an elongated deformable portion adjacent the elongated slot and a movable portion adjacent the deformable portion, and a thermal trip assembly coupled to the movable portion. A calibration device includes a forked tool straddling the deformable portion. The trip assembly has a first thermal response. The calibration device rotates the tool in a first rotational direction and responsively deforms the deformable portion and moves the movable portion in a first direction, in order to calibrate the trip assembly for a second different thermal response. The calibration device rotates the tool in an opposite second rotational direction and responsively deforms the deformable portion and moves the movable portion in an opposite second direction, in order to re-calibrate the trip assembly for a third thermal response between the first and second thermal responses.

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