Method of calibrating reflectance measuring devices

Details Method of calibrating reflectance measuring devices Method of calibrating reflectance measuring devices

G - Physics

01

N

354/29, 73/0.5

G01N 21/47 (2006.01)

Patent

CA 1297700

METHOD OF CALIBRATING REFLECTANCE MEASURING DEVICES Abstract Of The Disclosure A method of calibrating reflectance measuring devices, such as spectrophotometers, that incorporate automatic gain or sensitivity setting capability. According to the method, offset reflectance and reflectance of a second- ary reflectance standard for several wavelengths are calculated and stored in a memory of a reflec- tance measuring device. A secondary standard is mounted in the reflectance measuring device and reflectances at a selected wavelengths from the secondary standard are read prior to measurement of the reflectance of the test sample. The stored offset reflectance and secondary reflectance for the operational wavelength are used to calculate true reflectance of the test sample. MS-1449

538704

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