Method of determining the particle sensitivity of electronic...

Details Method of determining the particle sensitivity of electronic... Method of determining the particle sensitivity of electronic...

G - Physics

01

R

G01R 31/302 (2006.01) G01R 31/28 (2006.01) G01R 31/308 (2006.01) G01R 31/3183 (2006.01)

Patent

CA 2700610

To analyse an electronic component, this component is exposed to a focused laser beam. The information provided by the laser mapping relating to the position and to the depth of the sensitivity zones of the component is used as input parameter in prediction codes for quantifying the sensitivity of the mapped component to ionizing particles in the natural radiative environment. The prediction codes are used to determine the occurrence of malfunctions in the electronic component. Determination of the risks associated with the radiative environment imposes two aspects: one, probabilistic, takes into account the particle/matter interaction and the other, electrical, takes into account the charge collection inside the electronic component.

Image Pour analyser un composant électronique, on prévoit de soumettre ce composant à un rayonnement laser focalisé. La connaissance fournie par la cartographie laser relative à la position et à la profondeur des zones de sensibilité du composant est utilisée en tant que paramètre d'entrée dans des codes de prédiction pour quantifier la sensibilité du composant cartographie vis-à-vis des particules ionisantes de l'environnement radiatif naturel. Les codes de prédiction permettent d'évaluer l'occurrence des dysfonctionnements dans le composant électronique. L'évaluation des risques liés à l'environnement radiatif impose deux aspects : l'un, probabiliste, prend en compte l'interaction particule/matière, l'autre, électrique, prend en compte la collection de charges à l'intérieur du composant électronique.

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