Method of electrical short testing and the like

Details Method of electrical short testing and the like Method of electrical short testing and the like

G - Physics

01

R

324/58.4

G01R 31/02 (2006.01)

Patent

CA 1165395

METHOD OF ELECTRICAL SHORT TESTING AND THE LIKE Abstract This disclosure is concerned with a process for connecting a short detector to electrical nodes in such apparatus as backplanes, cables, and circuit boards, before and after component assembly, to identify shorted node pairs in a substantially smaller number of tests than required by previously known methods, through a novel series of tests between each node and all other nodes, taken together, so as to identify shorted nodes, and then a series of tests between each of these shorted nodes and all other shorted nodes, taken individually, to identify the shorted node pairs.

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