G - Physics – 03 – F
Patent
G - Physics
03
F
96/266
G03F 7/26 (2006.01) G03F 7/00 (2006.01) G03F 7/40 (2006.01)
Patent
CA 1264596
- 35 - Abstract of the Disclosure A resist pattern is formed on a substrate by forming a resist on a substrate and radiating an energy beam carrying predetermined pattern information onto the resist, thereby forming a recessed pattern in a surface portion of the resist so as not to extend through the resist. A flat mask layer is formed on the resist including the recessed pattern. The mask layer is uniformly etched along a direction of thickness thereof until at least a surface of the resist is exposed to allow the mask layer to remain on at least a bottom of the recessed pattern, thereby forming a mask pattern comprising the remaining residual mask layer. Finally, the resist is etched by using the mask pattern as an etching mask.
478690
Harada Katsuhiro
Ishii Tetsuyoshi
Matsuda Tadahito
Moriya Shigeru
Nippon Telegraph And Telephone Corporation
Ridout & Maybee Llp
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