Method of making an ohmic contact to p-type silicon carbide,...

H - Electricity – 01 – L

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

H01L 23/482 (2006.01) H01L 21/04 (2006.01) H01L 21/24 (2006.01)

Patent

CA 2322595

A method of producing an ohmic contact to p-type silicon carbide comprising two layers, the first one comprising nickel silicide and the second one comprising titanium carbide is disclosed. The deposited layers are annealed to convert at least a part of deposited metals to nickel silicide and titanium carbide. The contact is formed by reaction between the metals and the semiconductor, and thus the in-situ simultaneous formation of metal silicide and carbide suppress the release of excess carbon at the contact interface. Noble metals may be deposited preferably in between titanium and nickel to improve the contact morphology.

LandOfFree

Say what you really think

Search LandOfFree.com for Canadian inventors and patents. Rate them and share your experience with other people.

Rating

Method of making an ohmic contact to p-type silicon carbide,... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of making an ohmic contact to p-type silicon carbide,..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of making an ohmic contact to p-type silicon carbide,... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFCA-PAI-O-1472448

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.