G - Physics – 01 – N
Patent
G - Physics
01
N
358/6
G01N 23/223 (2006.01)
Patent
CA 2009698
Abstract of the Disclosure The plating amount and composition of a plated steel plate are measured by determining a theoretical relation for an intensity at two different light- receiving angles of K-series fluorescent X-rays of analysis target elements reflected by the plate when monochromatized X-rays are radiated onto the plate at two incident angles, measuring a fluorescent X-ray intensity by using standard samples having known plating amounts and compositions, under the same conditions as for obtaining the theoretical relation, and calculating a conversion coefficient for converting the measured value into a theoretical value by the theoretical relation, measuring a fluorescent X-ray intensity obtained from a plated steel plate to be measured having unknown plating amount and composition under the same conditions for obtaining the theoretical relation, and converting the measured fluorescent X-ray intensity into a theoretical intensity by using the conversion coefficient, and calculating a plating amount and composition as parameters in the theoretical relation, which minimize a difference between the theoretical intensity obtained by the theoretical relation and the converted theoretical intensity, as a plating amount and composition of the plate to be measured.
Hattori Tadaaki
Imai Kiyotaka
Kato Hiroharu
Nishifuji Katsuyuki
Nkk Corporation
Ridout & Maybee Llp
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