G - Physics – 01 – N
Patent
G - Physics
01
N
358/12
G01N 23/223 (2006.01)
Patent
CA 1136292
NILS JOHANNES BAECKLUND A METHOD OF MEASURING THE CONTENT OF A GIVEN ELEMENT IN A SAMPLE BY MEANS OF X-RAY RADIATION ABSTRACT OF THE DISCLOSURE A method of measuring the content of a given ele- ment in a sample by means of X-ray radiation. The sample is first irradiated with primary radiation of a given wave length, to excite first composite fluorescent radiation from the sample whose content of said element is to be determined. Subsequent hereto the sample is then irradiated with primary radiation having a shorter wave length than the first mentioned radiation, to excite a second fluore- scent radiation from said sample. The magnitude of the first fluorescent radiation is then subtracted from the magnitude of the second fluorescent radiation, whereat the difference therebetween constitutes the intensity of fluorescence radiation of the shortest wave length which can be excited by the primary radiation having the shorter wave length.
357114
Baecklund Nils J.
Swabey Ogilvy Renault
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