Method of operating an ion trap mass spectrometer in a high...

Details Method of operating an ion trap mass spectrometer in a high... Method of operating an ion trap mass spectrometer in a high...

H - Electricity

01

J

H01J 49/20 (2006.01) H01J 49/42 (2006.01)

Patent

CA 2066893

A method of analyzing a sample trapped within a three-dimensional ion trap which includes combined quadrupole and supplementary A.C. fields in which the combined fields are scanned to resonantly eject ions of consecutive mass-to-charge ratio from the trap at a rate so that the length of time corresponding to 200 cycles or more of the supplementary field occurs per consecutive thomson.

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