Method of providing a concurrent overview and detailed...

Details Method of providing a concurrent overview and detailed... Method of providing a concurrent overview and detailed...

G - Physics

06

Q

G06Q 10/06 (2012.01) G05B 23/00 (2006.01) G06F 3/14 (2006.01)

Patent

CA 2504326

A method of providing a concurrent overview and detailed display of an industrial production facility, involving the step of monitoring selected assets of an industrial production facility by assigning to each of the selected assets a space on a visual display. A selected attribute common to some or all of the selected assets is reflected in a size of the space assigned to an individual one of the selected assets, such that selected assets having more of the selected attribute are assigned a proportionately larger space than selected assets having less of the selected attribute.

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