Method of rapidly screening x-ray powder diffraction patterns

Details Method of rapidly screening x-ray powder diffraction patterns Method of rapidly screening x-ray powder diffraction patterns

G - Physics

01

N

G01N 23/20 (2006.01) G01T 1/36 (2006.01) G06K 9/62 (2006.01)

Patent

CA 2326062

A method for rapidly screening multiple X-ray powder diffraction patterns, such as those generated through combinatorial chemistry, has been developed. The method is directed toward measuring X-ray powder diffraction patterns of a set of samples, factoring the patterns using a suitable statistical technique into a small number of discrete components or factors, determining the scores corresponding to the factors for each X-ray powder diffraction pattern, and plotting the scores. The graphs of the scores are then inspected for clusters, trends, or outliers, which may represent new material or, perhaps, faulty data.

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