Method of seeking at least one analyte in a medium likely to...

Details Method of seeking at least one analyte in a medium likely to... Method of seeking at least one analyte in a medium likely to...

G - Physics

01

N

G01N 21/47 (2006.01)

Patent

CA 2736591

The invention relates to a method for seeking the presence of an analyte bound to a probe, in which a periodic geometrical pattern (24), constituting a diffracting system (2), is formed by an alternation of zones with a probe A and zones with no probe A. The diffracting system (2) is produced so as to be diffracting before a sensitization step, i.e. a step during which a probe is temporarily brought into contact with a medium likely to contain an analyte and during which the possible analyte is fixed to the probe. The method comprises at least the following steps: measurement of a power P1 of a first-order diffraction beam of a diffraction field produced by the defracting system, probe A not sensitized; sensitization of probe A; measurement of a power P1a of a first-order diffraction beam of a diffraction field produced by the diffracting system; and comparison of the measured powers P1 and P1a.

L'invention concerne un procédé pour rechercher la présence d'un analyte lié à une sonde, dans lequel un motif géométrique périodique (24), constituant un système diffractant (2), est formé par une alternance de zones comportant une sonde A, et de zones ne comportant pas la sonde A. Le système diffractant (2) est réalisé pour être diffractant avant une étape de sensibilisation, c'est-à-dire une étape au cours de laquelle une sonde est mise en contact temporairement avec un milieu susceptible de contenir un analyte et au cours de laquelle l'éventuel analyte se fixe à la sonde. Le procédé comporte au moins les étapes de : - mesure d'une puissance P1 d'un faisceau de diffraction d'ordre 1 d'un champ de diffraction produit par le système diffractant, sonde non sensibilisée, - sensibilisation de la sonde A, - mesure d'une puissance P1a d'un faisceau de diffraction d'ordre 1 d'un champ de diffraction produit par le système diffractant, - comparaison des puissances mesurées P1 et P1a.

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