Method of transferring impurities from region to region of a...

H - Electricity – 01 – L

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356/165, 356/178

H01L 21/20 (2006.01) H01L 21/225 (2006.01) H01L 21/285 (2006.01)

Patent

CA 1223976

- 10 - A METHOD OF TRANSFERRING IMPURITIES FROM REGION TO REGION OF A SEMICONDUCTOR DEVICE Abstract The contact to the source-drain region in advanced memory arrays has a width of tune order of the minimum feature size. The source-drain has similar minimum feature dimensions in width to keep the array optimally dense. Thus this contact is made "headless" and requires a "line on line" alignment. Some offset in forming the window is inevitable and that offset exposes the channel stop. The contact then shorts to the substrate. Using a polysilicon transfer layer with an appropriate post anneal the region immediately under the contact and along the window sidewall can be autodoped sufficiently to avoid shorts to the substrate, and provide a continuous electrical path for the deposited contact.

478432

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