Method of using an atomic force microscope and microscope

G - Physics – 01 – Q

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

G01Q 60/32 (2010.01)

Patent

CA 2613515

The invention relates to a method of using an atomic force microscope and to a microscope. The inventive method comprises the following steps consisting in at least performing bimodal excitation of a microlever (M) which is disposed on a sample and analysing at least: the variation in the oscillation amplitude (Ai) of an output signal (Aicos(.omega.it-.phi.i)) that is representative of the response from the microlever (M) to the excitation of one of the natural vibration modes thereof, in order to obtain topographic information in relation to the sample; and the variation in the phase (.phi.j) of an output signal (Ajcos(.omega.jt-.phi.j)) that is representative of the response from the microlever (M) to the excitation of another natural vibration mode thereof, in order to obtain compositional information in relation to the sample. The inventive microscope is adapted to be used with the aforementioned method.

L'invention décrit un procédé qui consiste à réaliser une excitation bimode minimale d'un microlevier (M), à le disposer sur un échantillon et à analyser la variation d'amplitude minimale (A ) d'oscillation d'un signal de sortie (A cos(.omega. t-.phi. )) représentatif de la réponse dudit microlevier (M) à l'excitation d'un de ses modes naturels de vibration, pour obtenir l'information topographique dudit échantillon, et la variation de la phase (.phi.j) d'un signal de sortie (Ajcos(.omega. t-.phi.j)) représentatif de la réponse dudit microlevier (M) à l'excitation d'un autre de ses modes naturels de vibration, pour obtenir l'information de composition dudit échantillon. Le microscope selon l'invention convient à une utilisation selon le procédé décrit précédemment.

LandOfFree

Say what you really think

Search LandOfFree.com for Canadian inventors and patents. Rate them and share your experience with other people.

Rating

Method of using an atomic force microscope and microscope does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of using an atomic force microscope and microscope, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of using an atomic force microscope and microscope will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFCA-PAI-O-1426865

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.