G - Physics – 01 – N
Patent
G - Physics
01
N
G01N 30/82 (2006.01) G01N 30/74 (2006.01) G01N 35/10 (2006.01)
Patent
CA 2684774
Methods and apparatus for analyzing a sample using at least one detector are disclosed.
L'invention concerne des procédés et des appareils d'analyse d'un échantillon à l'aide d'au moins un détecteur.
Anderson James M. Jr.
Black Bruce D.
Bystron Josef P.
Helgemo Dirk
Mccreary Dennis K.
Alltech Associates Inc.
Gowling Lafleur Henderson Llp
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