G - Physics – 06 – F
Patent
G - Physics
06
F
G06F 19/00 (2006.01)
Patent
CA 2530666
A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a fabrication process for components based on test data for the components.
L'invention concerne un procédé et un appareil pour l'analyse de données, qui, selon divers aspects de l'invention, est configuré pour identifier automatiquement une caractéristique d'un procédé de fabrication pour des composants, sur la base de données d'essai pour lesdits composants.
Buxton Paul
Miguelanez Emilio
Tabor Eric Paul
Zalzala Ali M. S.
Gowling Lafleur Henderson Llp
Test Advantage Inc.
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