Methods and apparatus for data analysis

G - Physics – 06 – F

Patent

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G06F 19/00 (2006.01)

Patent

CA 2530666

A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a fabrication process for components based on test data for the components.

L'invention concerne un procédé et un appareil pour l'analyse de données, qui, selon divers aspects de l'invention, est configuré pour identifier automatiquement une caractéristique d'un procédé de fabrication pour des composants, sur la base de données d'essai pour lesdits composants.

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