Methods and system for measuring three dimensional spatial...

Details Methods and system for measuring three dimensional spatial... Methods and system for measuring three dimensional spatial...

G - Physics

01

C

G01C 11/10 (2006.01) G01B 11/03 (2006.01) G01B 11/25 (2006.01) G01C 11/26 (2006.01) G01C 25/00 (2006.01)

Patent

CA 2253085

The present invention relates to methods and system for measuring three dimensional spatial coordinates and for external camera calibration necessary for that measurement. A simple pattern of light is projected onto a surface and used as a photogrammetric target. Images of the simple pattern are captured by two or more cameras, and processed by a computer provided with software using conventional algorithms to identify homologous points. Either, these points are used to calculate the external calibration of the cameras, or they are used in conjunction with previously calculated external camera calibration in order to calculate three dimensional spatial coordinates on the surface of an object to be measured.

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