G - Physics – 01 – L
Patent
G - Physics
01
L
G01L 9/00 (2006.01) G01K 5/52 (2006.01) G01K 5/58 (2006.01) G01L 1/10 (2006.01)
Patent
CA 2133217
In a method for monitoring strain variations of a strain responsive element of a micromachined sensor device while subjected to outside parameter conditions, at least two oscillation resonance modes of said element are activated and interrogated optically. Thereby correspondingly at least two resonance frequencies are obtained. From parameter/frequency characteristics of said device correspondingly at least two parameter values are derived.
Douma Bindert S.
Eigenraam Peter
Shell Canada Limited
Smart & Biggar
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