Microprocessor control yield point tightening system

G - Physics – 01 – L

Patent

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354/28

G01L 5/24 (2006.01) B23P 19/06 (2006.01) B25B 23/14 (2006.01)

Patent

CA 1169560

ABSTRACT OF THE DISCLOSURE A method for tightening a fastener to yield point wherein areas under a torque-angle curve each include a constant abscissa and are successively measured. A decrease of area in a subsequently measured area, indicates that yield point of the fastener has occurred. Upon attainment of yield point, the final torque and angular rotation parameters are checked to determine if pre-set values have been realized. The method includes a preliminary torque-angle curve measure- ment to determine if certain conditions are satisfied; failure to satisfy such conditions, aborts the tightening operation.

380834

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