G - Physics – 02 – B
Patent
G - Physics
02
B
G02B 21/26 (2006.01)
Patent
CA 2705128
A stage (110) for supporting a specimen slide (114) and for calibrating a microscope (100) includes a base and a calibration component (120) integral with the base. The calibration component (120) includes at least one calibration element (120a) for positional calibration and at least one calibration element (120b) for optical calibration. Calibration of the microscope (100) can be performd without the need for independent calibration slides. The calibration component (120) may be a glass calibration component or may be defined by a calibration element formed or etched through the base.
La présente invention concerne un étage (110) permettant le support d'une diapositive échantillon (114) et permettant le calibrage d'un microscope (100) comportant un socle et un composant de calibrage (120) solidaire du socle. Le composant de calibrage (120) comporte au moins un élément de calibrage (120a) pour le calibrage de position et au moins un élément de calibrage (120b) pour le calibrage optique. Le calibrage du microscope (100) peut être réalisé sans nécessiter de diapositives de calibrage indépendantes. Le composant de calibrage (120) peut être un composant de calibrage en verre ou peut être défini par un élément de calibrage formé ou gravé à travers le socle.
Cytyc Corporation
Riches Mckenzie & Herbert Llp
LandOfFree
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