Microwave ice accretion meter

G - Physics – 01 – B

Patent

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340/139, 354/25

G01B 7/06 (2006.01) B64D 15/20 (2006.01)

Patent

CA 1196410

ABSTRACT A system for indicating ice thickness and rate of ice thickness growth on surfaces is disclosed. The region to be monitored for ice accretion is provided with a resonant surface waveguide which is mounted flush, below the surface being monitored. A controlled oscillator, provides microwave energy via a feed point at a controllable frequency. A detector is coupled to the surface waveguide and is responsive to electrical energy. A measuring device indicates the frequency deviation of the controlled oscillator from a quiescent frequency. A control means is provided to control the frequency of oscillation of the controlled oscillator. In a first, open-loop embodiment, the control means is a shift operated by an operator. In a second, closed-loop embodiment, the control means is a processor which effects automatic control.

418920

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