H - Electricity – 01 – J
Patent
H - Electricity
01
J
204/174
H01J 37/32 (2006.01)
Patent
CA 1172993
ABSTRACT OF THE DISCLOSURE A microwave plasma etching system is disclosed which comprises a vacuum chamber for providing a dis- charge space and provided with an inlet for introducing a discharge gas containing a fluorine-containing gas, hydrogen and oxygen, magnetic field forming means for forming a magnetic field in the discharge space, microwave electric field forming means for forming a microwave electric field in the discharge space, and substrates holding means for holding substrates to be processed in the vacuum chamber. In the microwave plasma etching, the discharge gas containing fluorine, hydrogen with or without oxygen provides excellent etching almost free from side etching.
385552
Kanomata Ichiro
Ninomiya Ken
Nishimatsu Shigeru
Okudaira Sadayuki
Saida Hiroji
Gowling Lafleur Henderson Llp
Hitachi Ltd.
LandOfFree
Microwave plasma etching does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Microwave plasma etching, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Microwave plasma etching will most certainly appreciate the feedback.
Profile ID: LFCA-PAI-O-1199817