Miniature inspection system

H - Electricity – 04 – N

Patent

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Details

H04N 7/18 (2006.01) G01N 21/88 (2006.01) G01N 21/956 (2006.01) H04N 9/47 (2006.01)

Patent

CA 2333585

A miniature inspection system for observing an object. The system comprises a camera defining an optical axis (8) defined between the camera and the object when located at the object inspection location. A ring light (14) is located concentrically with respect to and along the optical axis at a location between an entrance aperture of the camera and the object, when located at the object observing location. A field lens (10) is located along the optical axis at a location between the camera and the object, when placed at the object observing location. A mirror or a penta-prism may be located along the optical axis, between the camera and the field lens, so that light reflected from the object along the optical axis is reflected by either the mirror or the penta- prism toward the entrance aperture of the camera. An illumination source (50), may be also provided to supply illumination along the optical axis of the system.

L'invention porte sur un système d'examen d'objets très petits. Ledit système comporte une caméra dont l'axe optique (8) est placé entre la caméra et l'objet à examiner en place. Un anneau lumineux (14) concentrique à l'axe optique relie l'orifice d'entrée de la caméra à l'objet à examiner en place. Une lentille de champ (10) est disposée sur l'axe optique entre la caméra et l'objet à examiner en place. Un miroir ou un pentaprisme est disposé le long de l'axe optique entre la caméra et la lentille de champ de manière à ce que la lumière réfléchie par l'objet selon l'axe optique soit réfléchie par le miroir ou le pentaprisme vers l'orifice d'entrée de la caméra. On peut également prévoir une source d'éclairage (50) émettant de la lumière selon l'axe optique.

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