Mos image sensor

H - Electricity – 01 – L

Patent

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Details

H01L 27/14 (2006.01) H01L 27/146 (2006.01) H04N 3/15 (2006.01)

Patent

CA 2237505

An image sensor circuit which employs a photodiode in conjunction with a charge transfer mechanism. By employing the photodiode, at least a portion of the light sensed does not pass through a layer of polysilicon, and so is not prevented from reaching the sensing area by the polysilicon. The image sensor circuit of the invention is made up of device structures readily available in standard CMOS process technologies Advantageously, image sensors embodying the invention show substantially improved quantum efficiency for short wavelength light over the prior art sensors. In addition, image sensors embodying the invention display improved dark current uniformity, thus improving yield.

L'invention est un circuit capteur d'images qui utilise une photodiode conjointement avec un mécanisme de transfert de charges. En utilisant une photodiode, au moins une partie de la lumière détectée ne traverse pas une couche de polysilicium et, par conséquent, n'est pas empêchée d'atteindre la zone de détection par le polysilicium. Le circuit de l'invention est constitué de structures facilement disponibles sous la forme de dispositifs CMOS standard. Dans la concrétisation privilégiée de l'invention, les capteurs d'images ont un rendement quantique substantiellement amélioré aux courtes longueurs d'onde par rapport aux capteurs actuels. De plus, ils ont une plus grande uniformité quant au courant d'obscurité, ce qui accroît le rendement.

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