Multi-beam optical probe and system for dimensional measurement

Details Multi-beam optical probe and system for dimensional measurement Multi-beam optical probe and system for dimensional measurement

G - Physics

01

B

G01B 11/00 (2006.01) G01B 11/22 (2006.01) G05B 19/401 (2006.01)

Patent

CA 2638919

A multi-beam optical probe according to illustrative embodiments of the present invention generally reduce the limitations, difficulties and disadvantages of the conventional measurement devices and techniques by providing a non-contact multi-beam optical probe apparatus and system for the dimensional measurement of objects. The narrow elongated probe provides at least two orthogonal, divergent or parallel laser beams, the reflection of each beam on the object being simultaneously detectable without moving the probe.

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