Multi-socket board for open/short tester

Details Multi-socket board for open/short tester Multi-socket board for open/short tester

G - Physics

01

R

G01R 1/073 (2006.01) G01R 1/04 (2006.01)

Patent

CA 2488832

An interface structure (400) includes first(402a) and second portions(402b). The first portion has physical dimensions that are compatible with the docking area (356) of an associated device tester(352), and includes a first socket (304) configured to receive a first BGA package (100). The second portion, which is adjacent to and contiguous with the first portion, extends laterally beyond the docking area of the device tester to provide additional testing area that may include one or more additional sockets(404). In one embodiment, the second portion includes a second socket (404) configured to receive a second BGA package (200), wherein the second size and configuration of second BGA package are different from the size and configuration of the first BGA package.

L'invention porte sur une structure interface (400) comportant une première partie (402a) et une deuxième partie (402b). La première partie a des dimensions compatibles avec la surface (356) de pose d'un testeur (352) associé, et comporte une première prise (304) conçue pour recevoir un premier boîtier (100) à billes (BGA). La deuxième partie adjacente et contiguë à la première s'étend latéralement au-delà de la surface (356) de manière à offrir une surface de test additionnelle pouvant comprendre une ou plusieurs prises additionnelles (404). Dans une exécution, la deuxième partie comporte une deuxième prise (404) recevant un BGA (200) dont la taille et la configuration sont différentes de celles du premier (BGA).

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