Multifrequency eddy current testing device

G - Physics – 01 – R

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324/48

G01R 33/12 (2006.01) G01N 27/90 (2006.01)

Patent

CA 1124328

ABSTRACT Multifrequency February 9, 1981 The prior art of multifrequency eddy current instruments has required a band pass filter to separate each individual frequency. The drawback of the above mentioned method is the requirement to change the bandpass filter if the inspection frequency is changed. This invention relates to a design that eliminates the requirement for a bandpass filter. The aggregate of inspection frequencies are applied to linear multipliers which shift the information from one of the inspection frequencies to a base band signal. The information is then separated from the signals of other frequencies with a low pass filter. The advan- tage is that an inspection frequency may be changed by changing the oscillator frequency only.

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