G - Physics – 01 – N
Patent
G - Physics
01
N
G01N 21/31 (2006.01) B05C 11/10 (2006.01) D21H 23/78 (2006.01) G01B 11/06 (2006.01) G05D 5/03 (2006.01)
Patent
CA 2122020
The present invention relates to apparatuses and methods for measuring and controlling the amount of multiple coating materials applied to a substrate (12), and in particular to an apparatus (10) and method for monitoring and regulating the amount of multiple coating materials (24 and 25) containing different compositions applied to a substrate (12) such as paperboard. The coating measurement is insensitive to changes in both the amount of substrate (12) as well as in the amount of an interfering com- ponent associated with the substrate (12).
Anderson Leonard M.
Howarth John J.
Honeywell-Measurex Corporation
Measurex Corporation
Oyen Wiggs Green & Mutala Llp
LandOfFree
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