Ni/metal hydride secondary cell

Details Ni/metal hydride secondary cell Ni/metal hydride secondary cell

H - Electricity

01

M

H01M 4/32 (2006.01) H01M 4/02 (2006.01) H01M 4/36 (2006.01) H01M 10/34 (2006.01) H01M 4/52 (2006.01)

Patent

CA 2137965

Abstract of the Disclosure The massive irreversible loss of capacity of conventional Ni/metal hydride button cells with positive compacted-powder electrodes produced from a mixture of Ni(OH)2, Ni powder and oxide compounds of cobalt, when subjected to a relatively severe high temperature short circuit test (at 65°C and after 6 cycles), is made smaller and only temporary if the positive mass is additionally admixed with from 0.1 to 15% of manganese and/or a manganese oxide. The addition of manganese is made to prevent reductive destruction of the previously formed conductive CoOOH matrix under the conditions of the high temperature short circuit test, by stabilizing the matrix or promoting its ability to regenerate.

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