Nitride semiconductor growth method, nitride semiconductor...

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H01L 21/205 (2006.01) C23C 16/04 (2006.01) C23C 16/30 (2006.01) C30B 25/02 (2006.01) H01L 21/20 (2006.01) H01S 5/02 (2006.01) H01L 33/00 (2006.01)

Patent

CA 2258080

A method of growing a nitride semiconductor crystal which has very few crystal defects and can be used as a substrate is disclosed. This invention includes the step of forming a first selective growth mask on a support member including a dissimilar substrate having a major surface and made of a material different from a nitride semiconductor, the first selective growth mask having a plurality of first windows for selectively exposing the upper surface of the support member, and the step of growing nitride semiconductor portions from the upper surface, of the support member, which is exposed from the windows, by using a gaseous Group 3 element source and a gaseous nitrogen source, until the nitride semiconductor portions grown in the adjacent windows combine with each other on the upper surface of the selective growth mask.

Procédé assurant la croissance d'un cristal semi-conducteur de nitrure présentant très peu de défauts cristallins et pouvant être utilisé comme substrat. Ce procédé consiste à former un premier masque de croissance sélectif équipé d'une pluralité de premières fenêtres pour exposer de manière sélective la surface d'un support, sur un autre support présentant un plan principal et comprenant différents types de substrats formés de matériaux différents de ceux composant le semi-conducteur au nitrure; ensuite on fait se développer les semi-conducteurs de nitrure en utilisant une source fournissant un élément gazeux du groupe III et une source d'azote gazeux jusqu'à ce que les différentes portions de cristal semi-conducteur d'azote se développant dans des fenêtres adjacentes sur la surface du support exposée par cette fenêtre se rejoignent sur la surface supérieure du masque de croissance sélectif.

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