G - Physics – 01 – B
Patent
G - Physics
01
B
G01B 11/04 (2006.01) G01B 11/06 (2006.01) G01B 11/24 (2006.01) G01B 11/245 (2006.01) G01N 21/952 (2006.01)
Patent
CA 2160906
A non-contact inspection system capable of evaluating spatial form parameters of a workpiece (22) to provide 100% inspection of parts (22) in production. During production, it is not uncommon for one or more process to fail to produce the desired geometry of the part. The occurrence of such defects is not adequately monitored through other quality assurance processes. The system of the present invention causes parts (22) to be sequentially loaded onto an inclined track (16) where they pass through a test section (18). The test section (18) includes a length detection array (40) for measuring the length of the workpiece (22), which includes a source (43) generating a sheet of light oriented in the longitudinal direction of the workpiece (22). The profile of the parts (22) are evaluated by one or more light sources also creating a sheet of light oriented transverse to the longitudinal axis of the parts (22). Single channel photodetectors are provided for each of the sources which provides an analog output of the extent to which each sheet of light is occluded by the part (22). These outputs are analyzed through appropriate signal processing hardware and software to generate length and profile data related to the workpiece geometry.
Macrae & Co.
Mectron Engineering Company
LandOfFree
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