Non-contact tester for integrated circuits

Details Non-contact tester for integrated circuits Non-contact tester for integrated circuits

G - Physics

01

R

G01R 31/303 (2006.01)

Patent

CA 2404183

A non-contact tester for integrated circuits consists of an integrated circuit and independent scanning head, in combination. The integrated circuit includes a fabricated wireless contact and means for sending and micro-receiving signals via the wireless contact. The independent scanning head has a wireless contact compatible with the wireless contact on the integrated circuit. This enables data to be exchanged with the integrated circuit to confirm proper functioning of the integrated circuit.

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