Non-contacting workpiece gauging system

Details Non-contacting workpiece gauging system Non-contacting workpiece gauging system

G - Physics

01

B

33/61

G01B 11/00 (2006.01)

Patent

CA 1186894

Non-Contacting Workpiece Gauging System Abstract , A system for finding the position of a workpiece surface relative to a reference through non-contact gauging. The system uses a radiant energy beam pro- jected such that an illuminated spot moves along the workpiece surface with movement of that surface relative to the reference along a measurement direction. An array-type image detector, which is out of physica1 contact with the workpiece, detects the illumination at each of a number of small areas of the workpiece surface and generates signals representative of the detected illumination. These signals are converted into a test signal which is a function of the difference in overall illumination between larger areas of the workpiece sur- face. A reference signal is produced and stored for two known positions of a workpiece surface. The test signal and the reference signal are combined with each other to produce a measurement signal indicative of the position of the workpiece surface relative to the reference.

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