Non-destructive inspection system having self-aligning probe...

Details Non-destructive inspection system having self-aligning probe... Non-destructive inspection system having self-aligning probe...

G - Physics

01

N

G01N 37/00 (2006.01) G01D 11/00 (2006.01) G01N 27/90 (2006.01) G01N 29/24 (2006.01)

Patent

CA 2704719

An inspection system (10) comprises a sensor (16) configured to acquire inspection data of the object (24), a motion control device (11), a joint assembly (12) coupled to the motion control device (11), and a probe housing (13) coupled to the joint assembly (12) and configured to hold the sensor (16). The inspection system (10) further comprises a compliant element (14) coupled to the probe housing (13) and configured to cooperate with the joint assembly (12) and the motion control device (11) to position the sensor (16) relative to the object (24). A self-aligning probe assembly is also presented.

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