Non-destructive testing apparatus and method

Details Non-destructive testing apparatus and method Non-destructive testing apparatus and method

G - Physics

08

C

G08C 19/00 (2006.01) G01D 7/02 (2006.01) G01N 27/82 (2006.01)

Patent

CA 2339321

A non-destructive testing apparatus according to the present invention includes a detector, a display unit and a processor. The detector measures a test object to generate a measurement signal in a first coordinate system. The processor maps the measurement signal in the first coordinate system onto a second coordinate system to produce a second coordinate system measurement signal, removes a noise component from the second coordinate system measurement signal to produce a resultant signal, and controls the display unit to display the resultant signal. The processor may also attenuate a part of the noise component using a variety of filters. An apparatus according to the present invention, and a method therefor, may be used in order to test components within a system which may undergo influences such as vibration and heat change, therefore being susceptible to flaws or damages.

Affiliated with

Also associated with

Rating

Non-destructive testing apparatus and method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Non-destructive testing apparatus and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Non-destructive testing apparatus and method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1587547