Non intrusive and dynamic method and system for measuring a...

Details Non intrusive and dynamic method and system for measuring a... Non intrusive and dynamic method and system for measuring a...

G - Physics

01

B

G01B 7/14 (2006.01) G01B 7/02 (2006.01) G01H 11/00 (2006.01)

Patent

CA 2342092

A non intrusive method and system for the dynamic measurement of a distance, or the variations over time thereof, constituting the thickness, or the variations thereof, of a thin compressible dielectric material located between one or several other closely spaced solid dielectric layers of constant thickness and a conductive or semi-conductive surface.

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