Non-invasive force analysis system

Details Non-invasive force analysis system Non-invasive force analysis system

G - Physics

01

L

354/28, 73/58

G01L 1/24 (2006.01)

Patent

CA 2024832

1131-2 ABSTRACT In the past in order to measure the applied forces to an object contactwith the object, modification of the object, or adding a heavy or a bulky addition to the object was necessary. In the described method and apparatus for the non-invasive measurement of torque induced strain in an object, the photoelastic properties of certain materials is utilized. By attaching a small lightweight patch of photoelastic material to an object in such a manner as to allow it to be strained with the object, applied forces can be monitored, by observing the changes in the optical characteristics of the strained patch. The observed changes can then be correlated into a value for the applied forces at a remote location. Since all that is necessary for observation is fiber optic cables, this measurement system is almost completely non-obtrusive.

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